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Solid state x-ray detector calibration techniques and LINAC beam intensity measurements (December 1992)



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Author: Fasanello, Thomas J.
Publisher: Monterey, California: Naval Postgraduate School;Springfield, Va.: Available from National Technical Information Service
Language: en_US
Call number: o640575837
Digitizing sponsor: Naval Postgraduate School, Dudley Knox Library
Book contributor: Naval Postgraduate School, Dudley Knox Library
Collection: navalpostgraduateschoollibrary; fedlink; americana
Notes: some content may be lost due to the binding of the book.

Full catalog record: MARCXML

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Description

Thesis advisor(s): Xavier K. Maruyama

"December 1992."

Thesis (M.S. in Physics) Naval Postgraduate School, December 1992

Includes bibliographical references

X-ray fluorescence from thin foils inserted into the NPS linac have been used to measure the the integrated electron beam current only. The measured x-ray flux and the known inner shell ionization cross sections are used to obtain measurements of dark currents of the order of ten to the minus fourteenth amperes. The same arrangement allows continuous, in-situ energy calibration of our Si(Li) detector in the electromagnetic noise environment of the linac. This technique was originally developed to perform absolute production efficiency measurements of parametric x-ray generation in the 5-60 KeV range

Naval Postgraduate School author


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Format.extent: 52 p.;28 cm.
Identifier.oclc: o640575837
Type: Thesis
Contributor.advisor: Xavier K. Maruyama
Degree.name: M.S. in Physics
Degree.level: master's
Degree.discipline: Physics
Degree.grantor: Naval Postgraduate School
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